Materials Characterization

We utilize high resolution Field Emission Scanning Electron Microscopy imaging and Energy Dispersive Spectroscopy analysis to provide solutions for your Materials Characterization needs.

Nanoscale structures are easily visible using the Field Emission Scanning Electron Microscope, allowing us to visualize your smallest samples.

Nanometer size measurements can be made with the high resolution Field Emission SEM.

Our systems are calibrated to provide accurate Metrology data.