• We offer Optical Microscopy, SEM and X-ray characterization techniques
  • Correlative Imaging Applications
  • Metrology
  • Particle Size Analysis
  • Nanometer size measurements can be made with high resolution Field Emission SEM.

Our Field Emission Scanning Electron Microscope Systems are equipped with Energy Dispersive X-ray Spectroscopy capabilities.
Our Microanalytical techniques can provide solutions to your most challenging problems.