SEM Applications Support

  • SEMTech Solutions Analytical Test Lab can consult and collaborate with your team
  • Our Applications Support can provide you solutions to the most difficult analytical topics
  • Analytical Lab Manager has over 30 years in Electron Microscopy Applications
    • We offer support for Laboratory Design and Site Surveys
    • Sample Preparation Techniques
    • Imaging Techniques
    • Analytical Consultation
    • All levels of Operator Training on any SEM system
    • Advanced Applications Training

Applications include;

  • Nanotechnology
  • Semiconductors
  • Metallography
  • Contamination Identification
  • 3D Printing
  • Printing Technology
  • Bio Medical Devices
  • Thin Films and Laminates
  • Metrology
  • Forensics
  • Materials Characterization
  • Correlative Microscopy

Electron Microscopy Training

SEMTech Solutions offers training on a wide variety of Electron Microscopy topics.

We have been training customers since 1980!

Topics include;

  • Beam Alignment
  • Selection of Final Aperture
  • Centering of Final Aperture
  • Focus and Astigmatism
  • Correct Accelerating Voltage
  • Correct Working Distance
  • Spot size
  • Artifacts
  • Low Voltage Applications
  • Detector Selection
  • BSE mode
  • X-ray mapping
  • Linescans
  • K, L, M lines
  • Overlapping elements
  • Quantitative X-ray Analysis
  • Sample Size
  • Escape & Sum peaks
  • Calibration & Resolution Tests
  • Sputter coating
  • Variable Pressure SEM’s
  • Sample Preparation

Consultation available on additional topics, including Biological SEM Imaging,  TEM Imaging,  Correlative Microscopy Techniques, Advanced Sample Preparation including ultramicrotomy and other techniques, Focused Ion Beam (FIB/SEM) Applications and Technology, and other advanced microanalytical technologies such as EBSD, STEM, and AFM.